Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements
نویسندگان
چکیده
Electron backscatter diffraction (EBSD) has evolved into a well-established tool for microstructural characterization by providing quantitative information on crystallographic orientation and phase content and distribution. The rapid acceptance of EBSD as an analytical technique has been driven, in part, by the highly informative contrasts used to create different micrographs which effectively describe the microstructure of the material, including qualitative contrasts such as EBSD image quality measurements [1].
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